Abstract

Raman spectroscopy of polymer films using integrated optics has been shown to be a general technique applicable to films with thicknesses as small as 1 μ. With this technique no apparent interference from spectral features due to the substrate has been observed. It has been shown that compared to a bulk sample the scattering volume in the thin film has increased by 1 to 2 orders of magnitude which results in a Raman spectrum with considerably higher signal/noise ratio.

Raman spectroscopy of Cu-Sn-S ternary compound thin films prepared by the low-cost spray-pyrolysis technique

Viktor V. Brus, Ivan S. Babichuk, Ivan G. Orletskyi, Pavlo D. Maryanchuk, Volodymyr O. Yukhymchuk, Volodymyr M. Dzhagan, Igor B. Yanchuk, Mykhailo M. Solovan, and Iryna V. Babichuk
Appl. Opt. 55(12) B158-B162 (2016)

Simultaneous measurement of thermo-optic and stress-optic coefficients of polymer thin films using prism coupler technique

Md. Faruque Hossain, Hau Ping Chan, and Mohammad Afsar Uddin
Appl. Opt. 49(3) 403-408 (2010)

Raman scattering as a technique of measuring film thickness: interference effects in thin growing films

Kevin F. McCarty
Appl. Opt. 26(20) 4482-4486 (1987)

Simultaneous determination of thickness and optical constants of polymer thin film by analyzing transmittance

Changsoo Jung and Bum Ku Rhee
Appl. Opt. 41(19) 3861-3865 (2002)

Optical properties of extremely thin films: studies using ATR techniques

Jing-Jiang Xu and Jin-Fa Tang
Appl. Opt. 28(14) 2925-2928 (1989)