Characterization of Proton Exchange Layer Profiles in KD<sub>2</sub>PO<sub>4</sub> Crystals by Micro-Raman Spectroscopy

Thomas Huser; Christopher W. Hollars; Wigbert J. Siekhaus; James J. De Yoreo; Tayyab I. Suratwala; Teresa A. Land

Applied Spectroscopy
Vol. 58,
Issue 3,
pp. 349-351
(2004)

Characterization of Proton Exchange Layer Profiles in KD₂PO₄ Crystals by Micro-Raman Spectroscopy

Thomas Huser, Christopher W. Hollars, Wigbert J. Siekhaus, James J. De Yoreo, Tayyab I. Suratwala, and Teresa A. Land

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Thomas Huser, Christopher W. Hollars, Wigbert J. Siekhaus, James J. De Yoreo, Tayyab I. Suratwala, and Teresa A. Land, "Characterization of Proton Exchange Layer Profiles in KD₂PO₄ Crystals by Micro-Raman Spectroscopy," Appl. Spectrosc. 58, 349-351 (2004)

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Applied Spectroscopy